USED JEOL JSM 6460LV

Description

Manufacturer:
JEOL
Model:
JSM 6460LV
Category:
SCANNING ELECTRON MICROSCOPES
Vintage:
2002
Equipment Details:
Variable Pressure Scanning Electron Microscope (VP-SEM)
Tungsten electron emission tip: 30 kV
Vacuum / Gas pressure: 10-270 Pa
Large specimen chamber
With 5-Axes motorized
Magnification: 5x - 3,00,000x
3 Segment solid state back scattered electron detectors:
Composition mode imaging
Topography mode imaging
Shadow mode imaging
Tungsten filament
SEI, BEI in HV electron detectors
BEI in LV electron detectors
2 Oil pumps included
Operating system: Windows 2000
2002 vintage.